Laser diffraction is the standard method for measuring particle size in many industries. This technique is characterized by high flexibility and a wide measuring range from 10 nm to 4 mm. In contrast to the laser method, dynamic image analysis provides direct particle detection, thus allowing for characterization of particle shape. Moreover, it reliably detects small amounts of oversize or agglomerates.
In this webinar, we introduce Microtrac's new SYNC particle analyzer which combines the two techniques in one measuring device.
The advantages of each measurement method are presented and illustrated by examples. It will be demonstrated how the combination of laser diffraction and dynamic image analysis in one device provides the user with more information on the particles analyzed than possible with any other method.
Participation in the webinar is, of course, free of charge.
Język : angielski, niemiecki, rosyjski, japoński