Manufacturing reliable, high-quality solutions for characterizing particles is at the heart of our business. We produce Laser Diffraction, Dynamic and Static Image Analysis, Dynamic Light Scattering and Dust Characterization solutions in addition to the Sieve & Sieve Shaker solutions that our sister company Retsch has always offered.
Dynamiczna analiza obrazu
For particles ranging in size from 0.8 µm to 135 mm, Dynamic Image Analysis (DIA) offers a high-quality solution for particle characterization. Microtrac’s DIA solutions, developed over the last quarter of a century, conform to ISO 13322-2 standards and are capable of analysing 100s of images per second in real-time. In a matter of just a few minutes they can therefore characterize millions of individual particles.
DIA is made possible thanks to a high-resolution / high-speed dual camera system each of which has an ultrabright LED stroboscopic light source enabling miniscule exposure times to capture hundreds of images per second.
The true strength of DIA over other particle characterization techniques is the ability to measure the length & width of any particle and also to provide additional shape Information based on parameters that include aspect ratio, symmetry, roundness, etc.
Dyfrakcja laserowa
With Laser Diffraction (LD) particle characterization is carried out by measuring the angle of light scattered as particles pass through the laser beam(s). LD has a wide dynamic range from submicron upwards.
Results are generated quickly from a large number of particles in each sample with great repeatability and therefore the solution has been widely adopted and is covered by the ISO 13320 standard.
We offer a range of LD solutions with different laser configurations for particle sizing.
Statyczna Analiza Obrazu
For the most precise characterization of powders and suspensions from 0.5 µm to 1500 µm, Microtrac offers a static image analysis solution with a wide magnifications range, complying to the ISO 13322-1 standard.
The sample remains stationery during detection, unlike with DIA. This consequently ensures that every particle imaged in the selected view is pin-sharp. Particle measurement data can then be stored and an overview image gives the user a clear view of the particle quality for that sample.
